The JTAG Provision Boundary-scan Integrated Development Environment (IDE) is a test and programming application development suite that is used during product development, production and manufacturing to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This integrated professional JTAG boundary-scan development environment (IDE) software tool is fully automated and supports the import of design data from over 30 different EDA and CAD/CAM systems. Other key data inputs are JTAG device BSDL (description) models and a large, well-maintained model library describing thousands of non-JTAG devices including memories, bus logic, and other active and passive parts.
How it works
With the ProVision boundary-scan software suite you can rapidly generate a wide range of test and programming applications using a project database built up from the inputs above. All applications can be optimized, validated and run within the ProVision environment prior to delivery of the finished test sequences to the manufacturing and/or testing facility. ProVision comes with a built-in boundary-scan test sequencer for production ready test plans
ProVision’s development features are tightly integrated with JTAG Technologies’ advanced test coverage analysis tool and also with JTAG Visualizer graphical display system for design schematics and layouts. You can use these professional JTAG tools to quickly assess the thoroughness of the test during development and to make improvements prior to release.
The PMBus is simply a protocol that defines communication between power conversion devices, using SMBus (System Management Bus) as the physical layer. SMBus is in turn based on I2C with additional fault tolerant and error correction features.
In a standard PMBus set-up a separate interface header or a dedicated master devices must be employed to communicate with PMBus slaves. Using PMBusProg however allows the user to harness the power of the existing JTAG/boundary-scan driver/sensor pins and use these to synthesise a PMBus master.
JTAG Technologies’ ‘Classic’ Production Stand-Alone package (PSA) has, for many years, been the standard execution system operated in CEM and OEM factories when an independent boundary-scan test and/or device programming station is required. Introduced in the late 1990s to support applications generated by our ‘Classic’ development tools, several thousand PSA systems are still in use today. For new projects however ProVision Platform run-time system is usually recommended
Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if, then, else, and goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past and present.
With JTAG ProVision Flash you can program thousands of different flash types – even NAND and serial devices – using a variety of supported data formats. Flash memory programming applications include erase, blank-check, program, verify, lock, unlock, and read_id, which can be created automatically for over 20,000 parts. Generally flash in-system programming (ISP) applications utilise the built-in boundary-scan register of IEEE 1149.1 parts to control write/read cycles, however where programmable logic iterface directly with flash, bespoke IP applications can be used to greatly increase data throughput.
JTAG ProVision Flash is the easiest, fastest tool suite for development of ISP (In-System Programming) applications. It offers unmatched flexibility – multiple chains, multiboard designs and a re-usable project database.
Almost all today’s programmable logic devices (CPLDs and FPGAs) now utilise the IEEE std 1149.1 interface port to access their proprietary configuration circuits. Until 2001 the popular SVF (Serial Vector Format) was considered the de facto standard for streaming data into these parts and SVF remains popular to this day.
However as the IC vendors vied to produce the optimum data format/language for programming devices ‘in-system’ other standards appeared (JAM, STAPL, XSVF etc..) until the IEEE standards committee approved a universal standard that could be applied across designs bearing multiple vendor devices. The IEEE Std 1532 was finally approved in 2001 and as part of that standard a universal data format ‘ISC’ was introduced alongside enhanced BSDL models for compliant programmable parts.
Since the very first PLDs with JTAG programming were introduced JTAG Technologies have developed timely support packages that allow manufacturers to program all vendor parts at high speed. Today that support is provided through JTAG ProVision and the PIP and Symphony tester integration packages.
JTAG Technologies offers a range of options that can be used by engineers to improve their device programming facilities without adding much in the way of additional hardware. Our solutions for programming embedded (flash) memories of Microprocessors and DSPs are also known as SCIP (Serial Controlled IC Programmer) modules. The family comprises a wide range of software modules that can be used by test and production engineers to broaden the scope of their in-system device programming facilities without adding much or anything in the way of additional interface hardware.
While many devices have standardised on JTAG (IEEE Std 1149.1) as hardware interface for programming and testing there has been little in the way of standardisation regarding the way internal (flash) memories are programmed. The use of ‘Private’ instructions and non-standard state machine implementations have meant that some JTAG/boundary-scan tool-sets are unable to cope with the variety of devices that now use JTAG as their programming interface. Furthermore there exists a secondary layer of devices that use other, often lower pin count, interfaces to support their programming. Examples of these alternative interfaces are BDM, SPI, SWD (ARM Single Wire Debug) etc.. JTAG Technologies SCIP modules overcome these obstacles.
While a full ProVision system allows development and execution of integrated JTAG/boundary-scan test and programming software applications, it is possible to use the same familiar user interface in a reduced functionality version within production and manufacturing. ‘ProVision Platform’ is available for test execution only, flash in-system programming (ISP) only, PLD ISP only, or of course any combination of these.
Each ProVision Platform licence includes the capability to import ProVision development archives, execute applications and review test results in the familiar TTR (Truth Table Report) format and, optionally BSD (diagnotics) or Visualizer (graphical viewer). The system also includes the built-in boundary-scan test sequencer, our acclaimed AEX (Application EXecutive) manager, for application sequencing which itself includes if, then, else and goto structures for building more complex test and programming sequences as well as report generation and results storage by serial number.
JTAG Technologies Production Integration Packages allow users to execute the full range of JTAG board test and programming applications from a ‘third party’ environment. In addition to the test oriented front-ends such as National Instruments’ LabView and TestStand, JTAG Technologies also provides support for a range of generic compilers for Microsoft and others.
For C/C++ there is PIP/DLL, for .NET framework systems such as Visual C, Visual Basic etc. we offer PIP/.NET and for older Visual Basic compilers there’s also PIP/VB. There’s even a DOS/Win command line execution package called PIP/EXE. Each PIP package includes full capability to load and launch applications to test and program boards on our DataBlaster, Explorer or new MIOS (mixed-signal) IEEE Std. 1149.x boundary-scan controllers.
As a long-standing alliance partner with National Instruments, JTAG Technologies is able to offer a wide range of high-level integration options for the National Instruments’ control and test executive packages – TestStand, LabView and LabWindows/CVi. As part of our PIP (Production Integration Packages) family our National Instruments support options have enabled our customers to seamlessly and reliably integrate high-quality boundary-scan applications into their test and device programming systems for almost 20 years.
To test a board and program devices on it you need the following hardware:
- A JTAG controller connecting your PC or workstation with the JTAG interface on the board.
- I/O modules for boundary-scan access to I/O connectors and special test points on the board.
To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factor. The high speed JT 37×7 DataBlaster is the top model. It has a scalable performance and is available in a large variety of different form factors. The JT 5705 mixed signal controller supports control and measurement of analog signals in combination with boundary-scan. The JT 5705 Explorer controller with a USB interface is the ideal choice when a maximum performance is not the main driving factor.
Choose auxiliary I/O modules to add scan test and analog measurement coverage into portions of your design that lack boundary-scan access. Select digital I/O scan (DIOS) modules, mixed I/O scan (MIOS) modules, or Socket Test Modules (STM) to conveniently test sockets, connectors and sensors.
You can have your boundary-scan controllers and I/O modules as separate instruments, or you may combine them in a single instrument. The Rack- Mountable Instrument (RMIc) for example is a self-contained unit with one or more boundary-scan controllers and I/O modules of your choice, perfect for installation in a 19-inch test rack or in a benchtop set-up. The JT 5705 effectively combines a 2 TAP controller and mixed-signal IO (MIOS) channels, making it virtually a self-contained ATE.
The high-speed DataBlaster controllers are available in all of the popular formats (PCI, PCIe, PXI, PXIe, USB, Ethernet, Firewire) for stand-alone use as well as for seamless integration with your Functional Test System. For a seamless integration with your In-Circuit Tester or Flying Probe Tester dedicated form factors matching directly with the format of your tester are also available.
If you combine your JTAG controller with your In-Circuit Tester, Flying Probe Tester, or your Functional Test System you can use the test and measurement hardware of that system instead of auxiliary I/O modules to measure the I/O connectors and test points in combination with boundary-scan.
We’ve even got a product for remote operation over any distance, JTAG TapCommunicator. TapCommunicator is a truly unique product that can overcome problems caused by lack of target accessibility. By harnessing the native communications protocol of the target (e.g. E-net, Bluetooth, SpaceWire etc.) boundary-scan tests and programming applications can be applied over virtually any distance.
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