JTAG Functional Test
Application Dev Run-time Repair
Create tests for logic devices & memories
Perform limits testing on user-defined variables
Includes libraries for I2C, SPI comms and examples
Options for MicroProcessor core emulative test
Application Dev Run-time Repair
Creates board tests, system tests and programs devices
Multi-board systems with multiple netlist import
Built-in high-precision fault coverage analysis tool
Built-in application executive (AEX Manager)
Production Integration
Use PIPs to create bespoke JTAG sequences
Options for most high-level languages (VB, C++, .NET)
Includes multiple controller (DataBlaster) support
Support for 3rd party test executives

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