JTAG Functional Test
Application Dev
Run-time
Repair
Create tests for logic devices & memories
Perform limits testing on user-defined variables
Includes libraries for I2C, SPI comms and examples
Options for MicroProcessor core emulative test
ProVision Development
Application Dev
Run-time
Repair
Creates board tests, system tests and programs devices
Multi-board systems with multiple netlist import
Built-in high-precision fault coverage analysis tool
Built-in application executive (AEX Manager)
ProVision Platform
Run-time
Simple to use test and ISP run-time option
Includes report generation and export capabilites
Includes AEX Manager test executive
Password restricted entry for operators
We are boundary-scan
We will ensure that your organisation gets the maximum return on investments and receives the greatest benefits from this technology. Look through our website and support section for whatever kind of information you might need and feel free to contact us if the answer to your question is not provided.
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