Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x controllers and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors.

Add mixed-signal stimulus and measurement capabilities to your current JTAG test system with the JT5112 MIOS (Mixed-signal IO Scan) module.

Available in an impact-resistant enclosure or as a fixture-embedded version (/FXT) the JT 5112 works with all JT 37xx series of controllers. Measure and source analog values up to 30V on up to eight channels. Digital I/O on up to 64 channels. Also features frequency measurement capability and user programmable functions. Connections are via standard 0.1″ IDC plugs on the front of the unit. JTAG TAP and power connections at the rear.


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