Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x controllers and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors.
Add mixed-signal stimulus and measurement capabilities to your current JTAG test system with the JT5112 MIOS (Mixed-signal IO Scan) module.
Available in an impact-resistant enclosure or as a fixture-embedded version (/FXT) the JT 5112 works with all JT 37xx series of controllers. Measure and source analog values up to 30V on up to eight channels. Digital I/O on up to 64 channels. Also features frequency measurement capability and user programmable functions. Connections are via standard 0.1″ IDC plugs on the front of the unit. JTAG TAP and power connections at the rear.
The JT 2111/MPV is a 64 channel digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
The TAP signals can be accessed via the ‘fingers’ of the 168 pin module connector or a separate 10-pin connector. A TAP-out can be used to daisy-chain to another DIOS module or to a scan chain on the target board.
The JT 2124/F168 DIOS module is a highly configurable 128 channel DIMM DIOS in the familiar 168 pin format. It is similar to the JT 2122/MPV but has several enhanced features such as the ability to program I/O thresholds across a block of 16 channels and hot swap.
The JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.
The JT 2127 Socket Test Module (STM) family has been designed for manufacturing test of PCB DIMM sockets. They offer easy insertion in standard DIMM sockets on a target board and will test all active signals as well as the analog voltages on the individual power pins (such as Vdd, Vddq, Vref and Vddspd). JT 2127 STMs thereby provide a complete structural test of the DIMM sockets.
See also specifications section below.
JT 2702/PCI-Slot is a fixturing solution for the production testing of 32-bit and 64-bit PCI plug-in cards. The JT 2702/PCI-Slot features sacrificial female sockets compatible with both 32-bit and 64-bit versions of the PCI bus. On the reverse side of the test adapter board, two sockets house regular JT 2122/MPV DIMM DIOS modules that provide the DIOS channels required to test the PCI bus signals.
During 32-bit bus testing 19 ‘spare’ I/O channels are available at an IDC header that can be used for fault detection on other UUT connectors or test points. During 64-bit bus testing a total of 83 spare channels are available.
JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
By populating the JT 2702/DDC with one or two of JTAG Technologies DIMM/168 format DIOS units, the user can build either a 128 or 256 channel I/O system. Since the units can also be serially linked, a channel count in excess of 1000 IOs is easily achieved at a relatively low cost. Access to the channels is via eight standard 40-way 0.1″ IDC connectors.
The JT 2127/Flex STM is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialisation process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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