ATE Integration

Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).


We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).

In co-operation with Takaya’s principal European agents, Itochu, JTAG Technologies have developed an integration solution that utilises four I/O signals from the standard JT 37×7 controller JT2147 QuadPod connected to the four flying probes of a 9400 system. A custom version of JTAG’s execution software then interacts with the driving and sensing electronics used by the probes of the Takaya. Signals can be driven via boundary-scan and sensed with the flying probes or the other way around. Results and diagnostics are presented in the Takaya software environment.

Happy to serve you!

We have been able to solve thousands of board test problems by actively engaging with our customers. Once you become a JTAG Technologies customer you are an integral part of our business with free access to our world-wide support network.