ATE Integration

Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).

 

We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).

For the execution of boundary-scan applications with Takaya’s latest generation of flying probe testers, the  APT-1400F and APT-1600FD Series, the compact  JT 3703/USB boundary-scan controller together with the JT 2118 I/O module can be integrated into the probers.

The JT 3703/USB can be mounted on Takaya’s Multi-Probe Head for “close-to the probe” integration to contact the TAP signals on manufacturing test targets or UUTs (Unit Under Test). The I/O channels of the JT 2118 module are connected  to individual flying probes to provide auxiliary test signals to improve the test coverage on UUTs. By connecting I/O probes to a UUTs external connections or test points boundary-scan test developers can improve test coverage by increasing the drive/sense points and create tests that may not have been possible using just the on-board JTAG/boundary-scan resources. Examples include tests for open circuit faults on connectors, in-system device programming  or additional logic cluster tests.

The boundary-scan applications are developed with JTAG Technologies ProVision which in addition to the netlist and BOM data of a board, now also reads information about the test points accessible by the flying prober. The tests are executed from Takaya’s APT control software.

 

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We have been able to solve thousands of board test problems by actively engaging with our customers. Once you become a JTAG Technologies customer you are an integral part of our business with free access to our world-wide support network.