ATE Integration

Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).

In co-operation with Takaya’s principal European agents, Itochu, JTAG Technologies have developed an integration solution that utilises four I/O signals from the standard JT 37×7 controller JT2147 QuadPod connected to the four flying probes of a 9400 system. A custom version of JTAG’s execution software then interacts with the driving and sensing electronics used by the probes of the Takaya. Signals can be driven via boundary-scan and sensed with the flying probes or the other way around. Results and diagnostics are presented in the Takaya software environment.

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We have been able to solve thousands of board test problems by actively engaging with our customers. Once you become a JTAG Technologies customer you are an integral part of our business with free access to our world-wide support network.