JT 37×7/RMIc DIO-0/64

High-speed and high-performance JTAG Boundary-scan controller with upto 64 channels of digital IO (DIOS) developed for inclusion in the JT 57xx/RMIc 19″ rack-mount chassis. The unit features three PC interface standards: USB Ethernet and Firewire

JT 37×7/RMIC DIO-0/64 boundary-scan controller modules are targeted at demanding manufacturing test applications such as fast in-system flash memory programming and and vector intensive test applications. The additional DIOS channels extend the testers capability allowing further fault coverage at test points and/or UUT connectors.

The JT 37×7/RMIC DIO-0/64 DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with an integral four TAP port signal conditioning module – the JT 2147 ‘QuadPOD‘ – as standard. TAP and IO connectors are available from the front panel in convenient 20-pin IDC ‘headers’

The same high-speed controller technology is also available in PCI/PCIe, PXI/PXIe and Desktop form factors.

See the form factors, more images and applications tabs below for more details.


  • 19" Rack mountable
  • Test up to four boundary-scan chains simultaneously
  • High-speed device programming
  • optional 256 boundary-scan I/O’s to enhance test access and maximum coverage
  • Three serial interfaces: USB (1.1 and 2.0), Ethernet and Firewire.
  • Scalable architecture with easy expansion to match application requirements
  • Automatic TCK speed matching and programmability for optimum chain performance, up to 40 MHz continuous data rate
  • Enhanced Throughput Technology™ (ETT) & gang operation delivers high volume production capability
  • Independent control of four TAPs per DataBlaster controller via JT 2147 QuadPOD™ system (included)
  • Different QuadPod versions optionally available for maxiumum flexibility.

DataBlaster’s scalable architecture provides three levels of operating performance to match the application requirements:

  • JT 3707: Base-level for board testing, CPLD programming and flash programming of small data blocks
  • JT 3717: Board testing, CPLD programming, and programming of moderate-size flash memories in manufacturing and debugging
  • JT 3727: All applications including board testing and in-system programming of large flash memories and CPLDs in manufacturing and debugging
  • Modular function adaptation
  • 40 MHz sustained TCK
  • Four voltage programmable 1149.x TAPs (1.0V to 3.6V)
  • Compatible with JT 2149/MPV-0xx SCIL modules

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