JT 37×7/PXIe

High speed, high-performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.

JT 37×7 boundary-scan controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and and vector intensive test applications.

The JT 37×7/PXIe DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the desktop JT 2147 ‘QuadPOD‘ – as standard, however alternative ‘mass-interconnect’ variants of the pod designed for Virginia panel (VPC) or MAC panel systems are also available for higher-reliability applications.

The same high-speed controller technology is also available in Rackmount, PCI/PCIe and Desktop form factors.

See the form factors, more images and applications tabs below for more details.

Features

  • Different PXI slots
  • Test up to four boundary-scan chains simultaneously
  • High-speed device programming
  • Gang controller operation for large-scale parallel programming and testing
  • Scalable architecture with easy expansion to match application requirements
  • Automatic TCK speed matching and programmability for optimum chain performance, up to 40 MHz continuous data rate
  • Enhanced Throughput Technology™ (ETT) & gang operation delivers high volume production capability
  • Independent control of four TAPs per DataBlaster controller via JT 2147 QuadPOD™ system (included)
  • Different QuadPod versions optionally available for maxiumum flexibility.

DataBlaster’s scalable architecture provides three levels of operating performance to match the application requirements:

  • JT 3707: Base-level for board testing, CPLD programming and flash programming of small data blocks
  • JT 3717: Board testing, CPLD programming, and programming of moderate-size flash memories in manufacturing and debugging
  • JT 3727: All applications including board testing and in-system programming of large flash memories and CPLDs in manufacturing and debugging
  • Modular function adaptation
  • 40 MHz sustained TCK
  • Four voltage programmable 1149.x TAPs (1.0V to 3.6V)
  • Compatible with JT 2149/MPV-0xx SCIL modules

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