The JT 3705/USB Explorer is a versatile, USB powered boundary-scan controller interface and features two test access ports (TAPs).

The controller is especially suited for low volume testing and in-system programming of (C)PLDs and small amounts of flash memory.

The two boundary-scan test access ports (TAPs) can be synchronized for test purposes allowing test pattern to be applied between devices on independent chains. Features include a programmable TCK frequency (6 MHz max.) and programmable input and output thresholds.


  • Fast test execution
  • Wide compatibility
  • Lightweight and pocket-sized
  • Low priced

This product is available in our JTAG Live Shop.

  • Two separate IEEE Std. 1149.x test access ports (TAPs) for versatile operation
  • Programmable TCK frequency (to 6MHz) and TAP signal thresholds
  • Powered from host PC
  • Supplied with standard JTAG pin-out cables and ‘flying lead set’
  • JT 3705/USB is aimed at design engineer hardware debug, field service/repair and low volume production applications.
  • Compatible with USB 1.1 and 2.0 formats
  • Two fully-compliant 1149.x TAPs
  • TCK up to 6 MHz
  • Programmable TAP voltage
  • 57 mm width x 79 mm depth x 16 mm height
  • Weight 49g

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