JT 2128 DIOS module

The JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.


  • Enhance test coverage
  • Improve diagnostic resolution
  • Easy insertion in target boards or test fixtures
  • Compatible with 168-pin DIMM sockets
  • Programmable voltage
  • Improves fault coverage
  • ‘Customisable’ functionality via Altera FPGA

Use JT2128 DIMMs in conjunction with a JT2702 DIMM carrier to provide low-cost high channel count I/O within custom test fixtures. Units can also be user-programmed for specific logic functions and can be built-in into a fixture kit that provides ‘Bed Of Nails’ test interface.

  • 128 channels of JTAG controlled DIO
  • Programmable functional test logic
  • I/O voltage ‘self adaptive’ within range of 1.8-3.3V
  • TCK speed upto 30 MHz

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