JT 2128 DIOS module
The JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.
- Compatible with 168-pin DIMM sockets
- Programmable voltage
- Improves fault coverage
- ‘Customisable’ functionality via Altera FPGA
Use JT2128 DIMMs in conjunction with a JT2702 DIMM carrier to provide low-cost high channel count I/O within custom test fixtures. Units can also be user-programmed for specific logic functions and can be built-in into a fixture kit that provides ‘Bed Of Nails’ test interface.
- 128 channels of JTAG controlled DIO
- Programmable functional test logic
- I/O voltage ‘self adaptive’ within range of 1.8-3.3V
- TCK speed upto 30 MHz
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