The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.

This JT2111/MPV DIOS module is also available through our webshop.



  • Compact multi-purpose system
  • Adds testing possibilities
  • (Re)configurable with SCIL functions

This product is available in our JTAG Live Shop.

  • Compact 64 channel I/O system in rugged housing
  • Choice of connector options (DIN or IDC)
  • Supports high clock (TCK frequencies)
  • TAP-IN, TAP-OUT feature allows daisy-chaining with UUT or other DIOS

JT2111/MPV can be used to extend fault coverage in benchtop or experimental test and board debug set-ups. Equally the unit can be enclosed with a production test fixture solution for volume testing. The 64 I/Os are grouped in four segments of 16 pins. Each segment can be bypassed in order to shorten the chain, thereby providing faster programming of flash devices.

The JT 2111/MPV derives its power from an AC adaptor. The input power supply voltage is hardware or software selectable at 1.5V, 1.8V, 2.5V or 3.3V. If 3.3V is selected, the voltage input is 5V tolerant.

  • 64 channels of digital I/O voltage selectable via rotary switch
  • Supports 3.3V (5V tolerant), 2.5V, 1.8V, 1.5V
  • Choice of connector options (DIN or IDC)
  • 200mA supply voltage for accessories
JT 2111/MPV – DIN

Equipped with a single 96-pin DIN 41612 connector.

JT 2111/MPV – IDC

Equipped with four 20-pin 0.1″ pitch IDC connectors.

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