JFT – JTAG Functional Test
JTAG Functional Test system (JFT) comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments’ LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, LabVIEW VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test ‘modules’. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
- Versatile test development environment
- Supported by popular test development APIs
- Includes comprehensive boundary-scan control functions
- Options for MicroProcessor core emulative test
Low-cost test development that requires boundary-scan capability without full (Automatic Test Program Generation) ATPG. For test system deveopers an integrators with basic requirements for using teh JTAG interface at a high level.
Happy to serve you!
We have been able to solve thousands of board test problems by actively engaging with our customers. Once you become a JTAG Technologies customer you are an integral part of our business with free access to our world-wide support network.