JTAG Functional Test system (JFT) is a simple to use DLL Application Program Interface (API) with a series of software modules that support boundary-scan test development and device programming activities under Python, National Instruments’ LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan .py test application scripts, LabVIEW Boundary-scan VI’s or .Net applications for PCB assemblies and systems. Applications are built-up via control of individual IC driver/sensor pins, groups of pins declared as variables, or register bits.

These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test ‘modules’. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)