JTAG Design solutions

The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.

It offers a maximum programmable TCK speed of 6 MHz and also features programmable output voltages and input thresholds.

The JTAG Live controller is compatible for use with both JTAGLive software and ProVision.

The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.

Features include 6MHz maximum TCK frequency and adjustable input and output thresholds.

The JT 3705/USB is support by ProVison‘s custom combined instrument feature that allows multiple controllers to act as one.

While Buzz allows the user to sample activity on boundary-scan pins and test continuity of nets across a circuit board, BuzzPlus extends its capability with a unique ‘seek and discover’ mode that effectively learns the network of nodes for a specified net connection.

JTAG Live Buzz is automatically included for free with this product.

AutoBuzz is a totally unique new tool that effectively learns a ‘connectivity signature’ of all boundary-scan parts within a design from only the BSDL models of those parts. By expanding on the seek and discover mode of BuzzPlus, AutoBuzz automatically gathers the circuit data of a known good board which is then saved as a reference. Compare mode is then used to check the known good reference against the faulty circuit.

JTAG Live Buzz is automatically included for free with this product.

Clip is the vector-based upgrade for creating and saving board-level tests. It features unlimited pattern depth and bit width. Clip’s logic analyzer-like waveform display shows you what’s happening with the signals on your board. Use Clip’s “Compare On” and “Set Breakpoint” options for complete execution control.

JTAG Live Buzz is automatically included for free with this product.

Script uses the open-source Python language to provide a powerful command and control structure to drive and sense boundary-scan I/O pins for ‘cluster’ testing.

Using Script, you’ll create Python code to verify operation of non-boundary-scan logic. LEDS and mixed signal devices. By means of high-level routines that can be embedded in a Python program, Script drives and senses values on pins or groups of pins defined as variables. The built-in JTAGLive Python editor simplifies preparation of the sequences to perform tests and collect results. Creating test modules in Script promotes device orientated testing and hence re-use of test code.

Using Python open source means that thousands of additional libraries can be obtained from the established user community.

JTAG Live Buzz is automatically included for free with this product.

CoreCommander routines take control of key processor core (e.g. ARM, PPC, X-scale, Cortex etc.) functions using the built-in emulation/debug functions found in today’s RISC and DSP cores. They have been developed to speed-up board testing and debug by enabling kernel-centric testing.

CoreCommander offer two modes of operation:

• Interactive – offering direct control of the core or;
• Python embedded – where controls can be scripted into a complete program.

JTAG Live Buzz is automatically included for free with this product.

JTAG Live Studio is your complete JTAG/boundary-scan solution for testing, debugging and programming your designs. Based on the  JTAG Live platform that now includes an automated scan path builder, Studio includes JTAG Live Buzz, BuzzPlus, AutoBuzz, Clip, Script, JAM, STAPL and SVF players PLUS a JTAG Live controller.

With the latest version of AutoBuzz, interconnections can be tested using a comparison with a known good board or by learning boundary-scan pin connections from a CAD-derived netlist. Create reusable cluster tests and flash programming actions in Python using Script. Include IC-level tests by adding low-cost CoreCommander options that can control IC cores and/or link to FPGA gate array fabric.

Get a free JTAG Maps for Altium license

JTAG Maps is an extension to Altium Designer EDA system that allows the user/engineer to quickly assess the capabilities of the JTAG devices on their design. Until now engineers could often spend hours highlighting the boundary-scan nets of a design manually to determine fault coverage. Today the free JTAG Maps for Altium application does all this and more, freeing-up valuable time, allowing a more thorough DfT and speeding time to market.

With or without boundary-scan models – boundary-scan device models (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However JTAG Maps for Altium can work with or without BSDL models and includes an ‘assume scan covered’ option. This feature can also be used to indicate fault coverage to a connector (set to assume scan covered) or to highlight the differences in fault coverage between two equivalent parts. JTAG Maps for Altium will also automatically trace the TAPs (Test Access Ports) from schematic data. The JTAG control nets associated with the TAPs will be highlighted separately from the ‘testable’ nets.

Import as well as export – while most users will want to simply use the coverage report that JTAG Maps for Altium can provide, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple text-based message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.

Optional Developer Tools– for engineers wishing to apply JTAG/Boundary-scan tests directly onto their design JTAG Technologies can offer two further options, JTAG Live for low cost functional testing with boundary-scan and JTAG ProVision a full-blown automated test program generation and device programming system

The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.

This JT2111/MPV DIOS module is also available through our webshop.

For customers that wish to use our software on different computers we offer the possibility to purchase our software license locked to a USB dongle. Add this product to your software order and we’ll deliver your software licenses linked to a compact Sentinel RMS license key.