I/O Modules
64 channel desktop Mixed I/O Scan (MIOS) module.
Add mixed-signal stimulus and measurement capabilities to your JTAG test system with the JT 5112 MIOS module. Measure and source analog values up to 30V on up to eight channels. Digital I/O on up to 64 channels – also features frequency measurement capability and user programmable functions.
With 56 purely digital channels and 8 digital/analog channels, connections on the JT 5112 are made via standard 20-way 0.1″ IDC plugs on the front of the unit with JTAG TAP and power connections at the rear. The voltage levels of the signals on the I/O banks can range from 1.05V through 3.60V @ ±8mA.
Special functions include frequency generation (1 ch), frequency measurement (16 ch) and pulse width measurement (1ch). Over Voltage Protection (OVP) is present on the digital I/O pins up to 0.6V over the set voltage with a maximum of 6V.
In addition to the desktop model, an open-frame ‘fixture’ version and a module for the JT 57xx 19″ rack-mount chassis are also available.
64 channel desktop Digital I/O Scan (DIOS) module with IDC connectors.
The module provides ‘boundary-scannable’ IO that is synchronized with the boundary-scan devices on your UUT. It has been developed to increase the test coverage of a printed circuit board by providing access to connectors and/or test points (pads). The additional IO access increases the possibilities for testing logic clusters and enhances interconnection test coverage using boundary-scan.
The 64 channels of JT 2111/MPV DIOS-IDC are available on the four 20-way IDC style connectors at the front of the unit. JTAG TAP and power connections are at the rear. Output threshold levels are adjusted through a rotary switch or by software (JFT application).
The JT 2111/MPV DIOS module is also available with a DIN 41612 connector.
64 channel desktop Digital I/O Scan (DIOS) module with 96-way DIN connector.
The module provides ‘boundary-scannable’ IO that is synchronized with the boundary-scan devices on your UUT. It has been developed to increase the test coverage of a printed circuit board by providing access to connectors and/or test points (pads). The additional IO access increases the possibilities for testing logic clusters and enhances interconnection test coverage using boundary-scan.
The 64 channels of JT 2111/MPV DIOS-DIN are available on the 96-pin DIN 41612 connector at the front of the unit. JTAG TAP and power connections are at the rear. Output threshold levels are adjusted through a rotary switch or by software (JFT application).
The JT 2111/MPV DIOS module is also available with IDC connectors.
Digital I/O Scan (DIOS) module with up to 128 or 133 ‘boundary-scannable’ I/Os in a standard DIMM-168 format.
To increase the test coverage of a printed circuit board the JT 2122/MPV fits directly in 168-pin DIMM sockets mounted on a PCBA to test the connectivity of those sockets.
The TAP signals can be accessed via the ‘fingers’ of the 168 pin module connector or a separate 10-pin connector. A TAP-out can be used to daisy-chain to another DIOS module or to a scan chain on the target board. The JT 2122/MPV is often used in conjunction with a JT 2702/DDC Dual DIMM Carrier ‘break-out’ board to create a high-density DIOS module. Two JT 2122/MPVs can be housed in one JT2702/DDC will provide 256 channels in a small footprint, ideal for mounting in test fixtures.
JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS break-out adapter that enables easy connection of JT 2122/MPV DIMM DIOS channels to UUT test points or connectors.
DIOS systems increase the test coverage of a printed circuit board by providing access to connectors and/or test points (pads). The additional IO access increases the possibilities for testing logic clusters and enhances interconnection test coverage using boundary-scan.
The JT 2702/DDC is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead. By populating the JT 2702/DDC with one or two of JTAG Technologies JT 2122/MPV DIMM DIOS modules I/O systems with 128 or 256 digital channels can be built. Since the units can also be serially linked, a channel count in excess of 1000 I/Os is easily achieved at a relatively low cost. The DIOS IO channels of the DIMMs are routed to eight standard 40-way 0.1″ IDC connectors.
Hardware adapter to connect a PCB-mounted DIMM & SODIMM socket to the JT 2127/DMU.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software.
The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialisation process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
For each DIMM type a special personality adapter JT 2127/Flex xxx is needed.
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