Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x high speed and performance controllers/interfaces and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors. For use in design, production and manufacturing and service.
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
It offers a maximum programmable TCK speed of 6 MHz and also features programmable output voltages and input thresholds.
The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
Features include 6MHz maximum TCK frequency and adjustable input and output thresholds.
The JT 3705/USB is support by ProVison‘s custom combined instrument feature that allows multiple controllers to act as one.
The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.
Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
The JT 5705/USB version (pictured right) is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable. The JT5705/FXT is the ‘fixture’ version supplied as a pcb assembly only with optional ‘break-out’ boards available depending on your application.
The use of JTAG/Boundary-scan combined with a number of mixed signal IO channels brings a new dimension to the bench-top ATE market. The JT 5705/FXT is a highly compact (less than 10cm x10cm) multifunction USB-powered instrument in its own right and offers two full JTAG TAPs (Test Access Ports) and 64 IO channels with a combination of Digital, Analog and Frequency measurement capabilities. The matching JT 2702/xx range of carrier boards have been designed to allow seamless integration of this powerful capability into an array of popular bench fixtures.
The already impressive specification of the JT 5705/FXT is enhanced by the addition of multiplexing circuitry on the carriers to increases the effective channel count further.
Advanced users can also take advantage of the FPGA technology used by the JT 5705/FXT to create custom applications/instruments, controlled through JTAG’s unique CoreCommander FPGA software.
SCIL (Scan Configured Interface Logic) modules are a range of hardware functions usually pre-programmed into pods that take the place of a regular TAP pod within the JT 37×7 DataBlaster’s QuadPod system. Alternative ‘hosts’ for SCIL functions can also be the JT 2111/MPV (desktop DIOS) or the JT 5112 (MIOS). Currently available SCIL modules for enhancing test coverage are counter/timer and pattern generator/comparator units. Other SCIL modules are used in tandem with a SCIP (Serial Controlled In-system Programming) software options for in-system programming purposes. SCIP/SCIL combinations are used for programming Freescale parts via BDM, and Mono8 interfaces. SPI, I2C, SWD, and Microchip custom one-wire protocols are also supported.
Further SCIL module functions can be developed upon request, simply contact us or your local sales office.
JTAG Technologies BSDL generation/verification system combines advanced software with a unique hardware interface and automatically verifies an existing BSDL (Boundary-Scan Description Language) file or creates a BSDL file for the device if none exists from a known good sample device. The system complies with the recognized standard for BSDL descriptions – IEEE Std. 1149.1b . BSDL files describe the boundary-scan characteristics of a specific device in terms of scan register lengths, ID codes, instruction codes, etc.. and are a fundamental input to ATPG (e.g. ProVision) and other boundary-scan software tools.
JTAG TapCommunicator facilitates remote execution and diagnostics of boundary-scan applications, regardless of distance or environmental difficulties. The off-the-shelf system is based on a one gigabit ethernet connection (IEEE Std 802.3z) providing virtually unlimited range between the controller and target. TapCommunicator is based on the ‘licencable’ TapSpacer IP, technology that allows any (packetised) communication link to be used. For solutions using communication links other than Ethernet, contact JTAG Technologies.
The standard TapCommunicator system consists of an “uplink” or primary module (JT 2143), located in proximity to the boundary-scan controller, and one or more “downlink” or secondary (JT 2144) modules at the target. Licenced TapSpacer systems will work in a similar way though it is expected the compact logic code (for uplink and downlink) will be integrated into the users own ASIC or FPGA.
The JT 5112 MIOS JTAG/Boundary-scan mixed signal I/O with analog output module , simply add mixed-signal stimulus and measurement capabilities to your current JTAG test system.
Available in an impact-resistant enclosure or as a fixture-embedded version (/FXT) the JT 5112 works with all JT 37xx series of controllers. Measure and source analog values up to 30V on up to eight channels. Digital I/O on up to 64 channels. Also features frequency measurement capability and user programmable functions. Connections are via standard 0.1″ IDC plugs on the front of the unit. JTAG TAP and power connections at the rear.
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The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
The JT 2149/MPV and the JT 2149/eMPV are a 32 channel multi purpose DIOS/TAP pod modules/interfaces that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of these units I/O interface pods enable increased fault coverage and thus improved diagnostic resolution during boundary-scan testing. The principal difference between the two versions is the use of an extended case on the eMPV that allows standard 0.1″ connections to be used to access ths TAP and static IO signals (see tab below)- on the standard /MPV unit these signals are available at the front face 0.05″ connector. The units are fully supported by JTAG Technologies’ development tools. Additional DIOS modules can be serially connected if more parallel access points are required.
The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
The modules are either ½ rack or ¼ rack width and are available as follows:
JT 5705/RMIc module (¼ width)
- 2 TAPs (15MHz)
- 64 mixed signal IO (MIOS) channels
JT 37×7/RMIc module (½ width)
- 4 TAPs(40MHz)
- 16 static IO channels
- optionally 64 DIOS channels (DIO-64 version only)
JT 5112/RMIc module (¼ width)
- 64 mixed signal IO (MIOS) channels
JT 5111/RMIc module (¼ width)
- 64 digital IO (DIOS) channels
Each of the modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.
The JT 2147 QuadPOD comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.
A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
The JT 2111/MPV is a 64 channel digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
This JT2111/MPV DIOS module is also available through our webshop.
The JT37x7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers available in bench-top (USB/E-net/FireWire), PXI(e)and PCI(e) formats.
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
See the form factors, more images and applications tabs below for more details.
The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
The JT 2147/eDAK is a new variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry plus four independent, programmable TAP modules (two of type JT 2149 and two of type JT2149/MPV) on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. Overall this configuration offers four Test Access Ports, 64 Digital IO Scan channels and reconfigurable (SCIL) capabilities
The JT 2147/VPC is a variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within Virginia Panel Corporation’s mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry, two independent, programmable TAP modules (of type JT 2149) and two TAP modules with I/O (of type JT 2149/MPV) on a single board that interfaces via the VPC QuadraPaddle connectors type G20x or G14x.
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
The TAP signals can be accessed via the ‘fingers’ of the 168 pin module connector or a separate 10-pin connector. A TAP-out can be used to daisy-chain to another DIOS module or to a scan chain on the target board.
The JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.
The JT 2127 Socket Test Module (STM) family has been designed for manufacturing test of PCB DIMM sockets. They offer easy insertion in standard DIMM sockets on a target board and will test all active signals as well as the analog voltages on the individual power pins (such as Vdd, Vddq, Vref and Vddspd). JT 2127 STMs provide a complete structural test of the DIMM sockets.
See also specifications section below.
JT 2702/PCI-Slot is a fixturing solution for the production testing of 32-bit and 64-bit PCI plug-in cards. The JT 2702/PCI-Slot features sacrificial female sockets compatible with both 32-bit and 64-bit versions of the PCI bus. On the reverse side of the test adapter board, two sockets house regular JT 2122/MPV DIMM DIOS modules that provide the DIOS channels required to test the PCI bus signals.
During 32-bit bus testing 19 ‘spare’ I/O channels are available at an IDC header that can be used for fault detection on other UUT connectors or test points. During 64-bit bus testing a total of 83 spare channels are available.
The JT2702 Digital 256 channel JTAG I/O module,
JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
By populating the JT 2702/DDC with one or two of JTAG Technologies DIMM/168 format DIOS units, the user can build either a 128 or 256 channel (digital) I/O system. Since the units can also be serially linked, a channel count in excess of 1000 IOs is easily achieved at a relatively low cost. Access to the channels is via eight standard 40-way 0.1″ IDC connectors.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialisation process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
The JT 2135 allows TAP signals to be extended away from the base JT 2137 (classic pod) by up to 1 meter and retain full pod’s frequency specifications. The active circuitry inside the JT 2135 compensates for the TDO signal return time of the longer interface cable. Multiple JT 2135s can be implemented if a longer extension is required.
The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..
JT 2149-CON is the safe way to connect TAP pods and SCIL modules to the JT 37×7/RMI – 19″ rack-mount controller with DIOS.
Included in the package is the connector/blanking plate that allows an easy connection to a JT 2149/RMI (the TAP pod for the RMI) via the supplied 1 metre extender cable.
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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