Boundary-scan controllers
Wide range of highly reliable JTAG/Boundary-scan IEEE Std.1149.x controllers and interfaces.
• Support Board (PCBA) Testing, System Testing and Device In-System Programming
• ETT (Enhanced Throughput Technology) and AutoWrite on selected models
• Multiple synchronised Test Access Ports (TAPs)
• Choice of USB, PXI (e), Ethernet, PCI(e) or Firewire formats
• Mixed signal options feature Frequency, Digital and Analog IO channels
• Seamless integration with 3rd party vendor hardware through customized solutions

The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
It offers a maximum programmable TCK speed of 6 MHz and also features programmable output voltages and input thresholds.
The JTAG Live controller is compatible for use with both JTAGLive software and ProVision.

The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
Features include 6MHz maximum TCK frequency and adjustable input and output thresholds.
The JT 3705/USB is support by ProVison‘s custom combined instrument feature that allows multiple controllers to act as one.

The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.
Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
The JT 5705/USB version is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable. The JT5705/FXT is the ‘fixture’ version supplied as a pcb assembly only with optional ‘break-out’ boards available depending on your application.

The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
The modules are either ½ rack or ¼ rack width and are available as follows:
JT 5705/RMIc module (¼ width)
-
- 2 TAPs (15MHz)
- 64 mixed signal IO (MIOS) channels
JT 37×7/RMIc module (½ width)
-
- 4 TAPs(40MHz)
- 16 static IO channels
- optionally 64 DIOS channels (DIO-64 version only)
JT 5112/RMIc module (¼ width)
-
- 64 mixed signal IO (MIOS) channels
JT 5111/RMIc module (¼ width)
-
- 64 digital IO (DIOS) channels
Each of the modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.

High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and Firewire
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
See tabs below for more details.

High speed and performance JTAG Boundary-scan plug-in controller for PCI bus slot or PCI Express bus slot.
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
See below for more details.

High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
See the form factors, more images and applications tabs below for more details.

High speed and performance 19″ rack-mount chassis assembly JTAG Boundary-scan controller, with optional up to 256 digital I/O’s to enhance test access and coverage
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
See the form factors, more images and applications tabs below for more details.
JTAG LIVE
Excellence in typography is the result of nothing more than an attitude.
Its appeal comes from the understanding used in its planning;
the designer must care. In contemporary advertising the perfect
integration of design elements often demands unorthodox typography.

Happy to serve you!
We have been able to solve thousands of board test problems by actively engaging with our customers. Once you become a JTAG Technologies customer you are an integral part of our business with free access to our world-wide support network.