Wide range of highly reliable JTAG/Boundary-scan IEEE Std.1149.x controllers and interfaces.
• Support Board (PCBA) Testing, System Testing and Device In-System Programming
• ETT (Enhanced Throughput Technology) and AutoWrite on selected models
• Multiple synchronised Test Access Ports (TAPs)
• Choice of USB, PXI (e), Ethernet, PCI(e) or Firewire formats
• Mixed signal options feature Frequency, Digital and Analog IO channels
• Seamless integration with 3rd party vendor hardware through customized solutions
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
It offers a maximum programmable TCK speed of 6 MHz and also features programmable output voltages and input thresholds.
The JT 3705/USB Explorer is a low-cost USB powered boundary-scan controller specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
Features include 6MHz maximum TCK frequency and adjustable input and output thresholds.
The JT 3705/USB is support by ProVison‘s custom combined instrument feature that allows multiple controllers to act as one.
The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.
Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
The JT 5705/USB version (pictured right) is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable. The JT5705/FXT is the ‘fixture’ version supplied as a pcb assembly only with optional ‘break-out’ boards available depending on your application.
The use of JTAG/Boundary-scan combined with a number of mixed signal IO channels brings a new dimension to the bench-top ATE market. The JT 5705/FXT is a highly compact (less than 10cm x10cm) multifunction USB-powered instrument in its own right and offers two full JTAG TAPs (Test Access Ports) and 64 IO channels with a combination of Digital, Analog and Frequency measurement capabilities. The matching JT 2702/xx range of carrier boards have been designed to allow seamless integration of this powerful capability into an array of popular bench fixtures.
The already impressive specification of the JT 5705/FXT is enhanced by the addition of multiplexing circuitry on the carriers to increases the effective channel count further.
Advanced users can also take advantage of the FPGA technology used by the JT 5705/FXT to create custom applications/instruments, controlled through JTAG’s unique CoreCommander FPGA software.
The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
The modules are either ½ rack or ¼ rack width and are available as follows:
JT 5705/RMIc module (¼ width)
- 2 TAPs (15MHz)
- 64 mixed signal IO (MIOS) channels
JT 37×7/RMIc module (½ width)
- 4 TAPs(40MHz)
- 16 static IO channels
- optionally 64 DIOS channels (DIO-64 version only)
JT 5112/RMIc module (¼ width)
- 64 mixed signal IO (MIOS) channels
JT 5111/RMIc module (¼ width)
- 64 digital IO (DIOS) channels
Each of the modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.
The JT37x7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers available in bench-top (USB/E-net/FireWire), PXI(e)and PCI(e) formats.
The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
See the form factors, more images and applications tabs below for more details.
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