Hardware

The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.

Features include 6MHz maximum TCK frequency and adjustable input and output thresholds.

The JT 3705/USB is support by ProVison‘s custom combined instrument feature that allows multiple controllers to act as one.

The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.

Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.

The JT 5705/USB version is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable. The JT5705/FXT is the ‘fixture’ version supplied as a pcb assembly only with optional ‘break-out’ boards available depending on your application.

The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.

The modules are either ½ rack or ¼ rack width and are available as follows:

JT 5705/RMIc  module (¼ width)

• • 2 TAPs (15MHz)
  • 64 mixed signal IO (MIOS) channels

JT 37×7/RMIc  module  (½ width)

• • 4 TAPs(40MHz)
  • 16 static IO channels
  • optionally 64 DIOS channels (DIO-64 version only)

JT 5112/RMIc  module (¼ width)

• • 64 mixed signal IO (MIOS) channels

JT 5111/RMIc  module (¼ width)

• • 64 digital IO (DIOS) channels

Each of the  modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.

High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and Firewire

The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘

The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

See tabs below for more details.

High speed and performance JTAG Boundary-scan plug-in controller for PCI bus slot or PCI Express bus slot.

The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘

The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

See below for more details.

High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.

The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘

The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

See the form factors, more images and applications tabs below for more details.

High speed and performance 19″ rack-mount chassis assembly JTAG Boundary-scan controller, with optional up to 256 digital I/O’s to enhance test access and coverage

The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘

The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

See the form factors, more images and applications tabs below for more details.