Hardware

The JT 3705/USB Explorer is a versatile, USB powered boundary-scan controller interface and features two test access ports (TAPs).

The controller is especially suited for low volume testing and in-system programming of (C)PLDs and small amounts of flash memory.

The two boundary-scan test access ports (TAPs) can be synchronized for test purposes allowing test pattern to be applied between devices on independent chains. Features include a programmable TCK frequency (6 MHz max.) and programmable input and output thresholds.

Compact mixed-signal desktop boundary-scan controller.

With its unique combination of 2 TAPs and 64 mixed signal I/O channels the desktop JT 5705/USB is ideal for hardware validation or small-scale production test. Use the IO (56 digital and 8 analog channels) to measure power supplies, clock frequencies, test DACs and ADCs and improve coverage to test points and connectors.

Maximum TCK speed is 15 MHz and all voltages are fully programmable.

Special fixture versions of the JT 5705 are available: JT 5705/BO and JT 5705/IB. Also a rack mount version is available JT 5705/RMIc.

The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.

The modules are either ½ rack or ¼ rack width and are available as follows:

JT 5705/RMIc  module (¼ width)

• • 2 TAPs (15MHz) – 64 mixed signal IO (MIOS) channels

JT 37×7/RMIc  module  (½ width)

• • 4 TAPs(40MHz) – 16 static IO channels
  • optionally 64 DIOS channels (DIO-64 version only)

JT 5112/RMIc  module (¼ width)

• • 64 mixed signal IO (MIOS) channels

JT 5111/RMIc  module (¼ width)

• • 64 digital IO (DIOS) channels

Each of the  modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.

High speed, high-performance, flexible and portable. The JT37x7/TSI JTAG Boundary-scan controller system features three PC interface standards: USB, Ethernet and Firewire, all housed in a robust desk-top package.

With four test access ports (TAPs) JT 37×7/TSI boundary-scan controllers are targeted at demanding manufacturing test applications, such as fast in-system flash memory programming and vector intensive test applications.

The JT 37×7/TSI DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the JT 2147 ‘QuadPOD‘ – as standard.

The same high-speed controller technology is also available in PCI/PCIe, PXI/PXIe and 19” Rackmount form factors.

See tabs below for more details.

High speed, high-performance, PCI-express plug in boundary-scan controller board. The JT37x7/PCIe series offer four test access ports (TAPs) and are targeted at demanding manufacturing test applications, such as fast in-system flash memory programming and vector intensive test applications.

The JT 37×7/PCIe DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the desktop JT 2147 ‘QuadPOD‘ – as standard.

The same high-speed controller technology is also available in Rackmount, PXI/PXIe and Desktop form factors.

See below for more details.

High speed, high-performance, PCI plug in boundary-scan controller board. The JT37x7/PCI series offer four test access ports (TAPs) and are targeted at demanding manufacturing test applications, such as fast in-system flash memory programming and vector intensive test applications.

The JT 37×7/PCI DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the desktop JT 2147 ‘QuadPOD‘ – as standard.

The same high-speed controller technology is also available in Rackmount, PXI/PXIe and Desktop form factors.

High speed, high-performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.

JT 37×7 boundary-scan controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and and vector intensive test applications.

The JT 37×7/PXIe DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the desktop JT 2147 ‘QuadPOD‘ – as standard, however alternative ‘mass-interconnect’ variants of the pod designed for Virginia panel (VPC) or MAC panel systems are also available for higher-reliability applications.

The same high-speed controller technology is also available in Rackmount, PCI/PCIe and Desktop form factors.

See the form factors, more images and applications tabs below for more details.

High speed, high-performance JTAG Boundary-scan controller for PXI slot.

JT 37×7 boundary-scan controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and vector intensive test applications.

The JT 37×7/PXI DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module – the desktop JT 2147 ‘QuadPOD‘ – as standard, however alternative ‘mass-interconnect’ variants of the pod designed for Virginia panel (VPC) or MAC panel systems are also available for higher-reliability applications.

The same high-speed controller technology is also available in Rackmount, PCI/PCIe and Desktop form factors.

See the form factors, more images and applications tabs below for more details.

High-speed and high-performance JTAG Boundary-scan controller with upto 64 channels of digital IO (DIOS) developed for inclusion in the JT 57xx/RMIc 19″ rack-mount chassis. The unit features three PC interface standards: USB Ethernet and Firewire

JT 37×7/RMIC DIO-0/64 boundary-scan controller modules are targeted at demanding manufacturing test applications such as fast in-system flash memory programming and and vector intensive test applications. The additional DIOS channels extend the testers capability allowing further fault coverage at test points and/or UUT connectors.

The JT 37×7/RMIC DIO-0/64 DataBlasters offer a programmable TCK of up to 40 MHz TCK and are available in three different memory configurations to suit your specific environment and application. Each unit is supplied with an integral four TAP port signal conditioning module – the JT 2147 ‘QuadPOD‘ – as standard. TAP and IO connectors are available from the front panel in convenient 20-pin IDC ‘headers’

The same high-speed controller technology is also available in PCI/PCIe, PXI/PXIe and Desktop form factors.

See the form factors, more images and applications tabs below for more details.