| Standard | 1st release, updates | |
| IEEE 1149.1 | 1990, 2001, 2013 | IEEE Standard Test Access Port and Boundary-Scan Architecture JTAG, JTAG Boundary-Scan, Dot1 |
| IEEE 1149.4 | 1999, 2010 | IEEE Standard for a Mixed-Signal Test Bus analog boundary-scan, Dot4 |
| IEEE 1149.6 | 2003, 2015 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks often called AC-EXTEST, Dot6 |
| IEEE 1149.7 | 2009 | IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture a superset of 1149.1 and fully compliant with it |
| IEEE 1149.8 | 2012 | IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components also referred to as toggle scan |
| IEEE 1149.10 | 2017 | IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture a high-speed packetized communications variant |
| IEEE 1532 | 2000, 2001, 2002 | IEEE Standard for In-System Configuration of Programmable Devices providing standardized programming access and methodology for programmable integrated circuit devices like CPLDs and FPGAs |
| IEEE 1581 | 2011 | Static Component Interconnection Test Protocol and Architecture also known as SCITT |
| IEEE 1687 | 2014 | IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device an extended internal JTAG architecture devised to access built-in device-level test instruments |
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