(DDR) Memory cluster testing with JTAG involves using JTAG boundary scan to test memory devices in a cluster on a printed circuit board (PCB). This process helps verify the functionality and integrity of memory devices on the board. Here’s a general guide on how to perform memory cluster testing with JTAG:
1. Hardware Setup:
- Ensure that your PCB has JTAG support and that all memory devices you want to test are connected to the JTAG chain.
2. JTAG Controller:
- Connect a JTAG controller, to the JTAG interface on the PCB.
3. Test Access Ports (TAPs):
- Verify that the JTAG TAPs for all memory devices in the cluster are correctly connected and identified by the JTAG controller.
4. JTAG Software:
- Use JTAG debugging software to control and manage the JTAG chain.
5. Memory Cluster Test Plan:
- Develop a test plan that specifies which memory devices you want to test and the test patterns and sequences to be applied to each device. The test plan should also define what constitutes a pass or fail for each device.
6. Boundary Scan Chain Configuration:
- Configure the boundary scan chain to include only the memory devices you want to test. Disable or bypass other devices in the JTAG chain.
7. Memory Testing:
- Execute the memory cluster testing by applying the test patterns and sequences defined in your test plan.
- Use the JTAG controller to access and control the memory devices in the cluster.
- Monitor and log the responses from the memory devices. Check for any errors or discrepancies against the expected results defined in your test plan.
8. Results Analysis:
- Analyze the test results to determine whether each memory device in the cluster passed or failed the test.
- Identify and log any failed devices or errors encountered during testing.
- Create a comprehensive test report that includes details about the memory cluster testing process, test results, and any actions taken for failed devices.
- Include the JTAG chain configuration details, test patterns, and expected results.
10. Debugging and Re-Testing: – If any memory devices fail the initial test, you may need to debug the specific issues, such as soldering problems, electrical connectivity issues, or memory device failures. – After making necessary adjustments or replacements, re-run the memory cluster test to verify the improvements.
11. Documentation: – Update the documentation for your PCB and JTAG test procedures to reflect any changes made during the testing and debugging process.
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