Improving Test Effectiveness Throughout Your Product’s Life Cycle

Boundary-scan, based on IEEE Standard 1149.1 and related specifications, has become very widely used in the electronics manufacturing industry to solve difficult test problems on complex PCBs. The difficulties arise due to lack of access needed by conventional test methods.

As boundary-scan has become broadly accepted, the quality of BSDL (boundary-scan model) files from the IC vendor
community and the level of sophistication of software and hardware from the test tools providers have risen dramatically.

Not so widely known, however, are the derivative uses and working environments for boundary-scan, which if
considered comprehensively, can lead to benefits across a product’s life cycle, not just in manufacturing testing.

Learn more about the impact of Boundary-scan?

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