Testing of an embedded digital system, a combination of electronics and software,  has traditionally required some sort of embedded software specifically created for testing. These test versions are downloaded to the product’s processor before testing is possible. ”A significant amount of work and project  time is  often spent on producing test versions of the embedded software and possibly FPGA code”, tells Senior Project Manager Ilpo Harjumäki.

”A new testing technology we have started to employ makes these separate test versions redundant. This new technology has been utilized within Etteplan for almost two years now” tells Ilpo Harjumäki proudly.  The new solution is based on a combination of  JTAG Functional Testing –  JFT, and National Instrumenst ‘LabVIEW’.

Based on JTAG
The JTAG/boundary scan pcb assembly test method is well-established. It is a separate function within the key ICs used in an assembley. When in use,  the relevant states (of device pins) are clocked to the outputs of the chained circuits using a serial bus. The input states are then read respectively and compared. However using the latest, essentially more flexible JFT  system from  JTAG Technologies a single pin or group of pins can be driven into a certain state to be read. With the addition of CoreCommander routines  users can also leverage the power of a microprocessor core to a desired value into the processor’s registers, setting up internal peripherals such as ADCs, DACs, PHYs and UARTS.

”It’s as if  this technology was made for us since Etteplan’s Procket testers support LabVIEW software”, praises Ilpo Harjumäki.

Read more at Etteplan

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