Interconnect testing with boundary scan

Interconnect testing with boundary-scan is a critical part of ensuring the reliability and functionality of complex electronic systems. Here’s how it works:

1. Boundary Scan Architecture: Boundary scan testing relies on a specialized hardware infrastructure embedded in digital devices. Each device in the chain, such as microcontrollers, FPGAs, or other digital ICs, includes a boundary scan register (BSR) that provides access to its input and output pins. These registers form a daisy-chain network that connects all the devices on the board or in a system.
2. Scan Chains: The boundary scan registers are connected in a series or daisy-chain fashion, creating a “scan chain” that spans all the devices on the PCB. This allows for serial data shifting through all the devices, providing access to their inputs and outputs.
3. Test Access Port (TAP): A Test Access Port (TAP) controller, often implemented using a dedicated chip, is used to control the scanning process. It communicates with each boundary scan register and manages the serial data shifting. The TAP controller typically conforms to the IEEE 1149.1 JTAG standard.
4. Interconnect Testing:
   • Open and Short Detection: Boundary scan can detect open and short-circuit faults in interconnections between devices. By applying test patterns and monitoring responses, it’s possible to identify faulty connections.
   • Cross-Talk and Impedance Testing: Advanced boundary scan techniques can also evaluate signal integrity by assessing cross-talk and impedance mismatches between signal lines.
5. Functional Testing: While boundary scan primarily focuses on interconnect testing, it can also be integrated with functional testing. This means you can execute functional tests on the digital devices in your system while utilizing the boundary scan infrastructure for interconnect testing.
6. Debugging and Diagnosis: Boundary scan is a valuable tool for debugging PCBs and identifying the location of faults. When a fault is detected, it can be traced back to the specific device and interconnect, making it easier to pinpoint the issue for repair or redesign.
7. Automated Testing: Boundary scan testing can be automated, making it suitable for high-volume production testing. Automated test scripts can be created to perform various interconnect and functional tests, streamlining the manufacturing process.
8. Benefits: The primary benefits of interconnect testing with boundary scan include increased fault coverage, reduced testing costs, faster fault diagnosis, and the ability to perform tests on devices that might otherwise be challenging to access physically.

In summary, interconnect testing with boundary scan is a powerful method for ensuring the integrity of interconnections on PCBs and digital devices. It is a valuable tool for manufacturing and debugging, particularly in complex electronic systems where traditional testing methods may be insufficient.