GEB Enterprise - Boundary-scan for high-speed dynamic testing | JTAG Technologies

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GEB Enterprise - Boundary-scan for high-speed dynamic testing

GEB Enterprise has accumulated more than thirty years experience in digital hardware design including printed circuit boards, ASIC and FPGA integrated circuits, as well as developing the related functional and boundary scan test programs. The multidisciplinary approach allows us to enjoy the advantages of boundary scan and exercise the hardware in dynamic full-speed tests.

Luciano Gabbani, General Director of GEB Enterprise: "The ProVision and JTAG Technologies JFT tools enable us to address at the same time our clients’ most complex projects, and offer simple, fast, and economical solutions for medium and low complexity designs”.
 

Applications: test engineering and production
Industry: test & measurement

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