JT 5112 MIOS | JTAG Technologies

JTAG Technologies

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JT 5112 MIOS

Add mixed-signal stimulus and measurement capabilities to your current JTAG test system with the JT5112 MIOS (Mixed-signal IO Scan).

Available in an impact-resistant enclosure or as a fixture-embedded version (/FXT) the JT 5112 works with all JT 37xx series of controllers. Measure and source analog values up to 30V on up to eight channels. Digital I/O on up to 64 channels. Also feature frequency measurement capability and user programmable functions. Connections are via standard 0.1" IDC plugs on the front of the unit. JTAG TAP and power connections at the rear.

 

  • 64 channels in total
  • 56 channels always digital
  • 16 frequency measurement channels 
  • 8 analog I/O (taken from 64 total)
  • Standard IEEE 1149.1 control interface
  • Choice of bench or fixture (/FXT) version.

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Benefits

Benefits

  • Compact 64 channel digital/analog I/O system 
  • Rugged construction
  • Supports high clock (TCK frequencies)
  • Reconfigurable FPGA for custom bus functions
  • Software set (SCIL) functions