JTAG Technologies

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JT 2128 DIOS module

The JT 2128 DIOS module increases fault coverage and improves the diagnostic resolution. The JT 2128 provides bi-directional parallel-scan access to up to 133 I/O channels grouped in three segments, each of which can be individually bypassed. The JT 2128 is designed for easy insertion in standard 168-pin DIMM sockets either on a target board, JT 2702/DDC break-out module or in a test fixture.

  • Enhance test coverage
  • Improve diagnostic resolution
  • Easy insertion in target boards or test fixtures

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  • Compatible with 168-pin DIMM sockets
  • Programmable voltage
  • Improves fault coverage
  • 'Customisable'  functionality via Altera FPGA