JFT - JTAG Functional Test | JTAG Technologies

JTAG Technologies

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JFT - JTAG Functional Test

JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits.  These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals  (ADCs, Memory Controllers etc..)

  • Create tests for logic devices & memories
  • Perform limits testing on captured variables
  • Access device internals with optional CoreCommander
  • Includes libraries for I2C comms and examples

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  • Versatile test devlopment environment
  • Supported by popular test development APIs
  • Includes comprehensive boundary-scan control functions
  • Options for MicroProcessor core emulative test