Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry's most reliable IEEE 1149.x controllers, specifically designed by us for high throughput and the best signal integrity. High-speed DataBlaster controllers are available in all of the popular formats (PCI, PCIe, PXI, USB, Ethernet, Firewire) and are performance-scalable. If economy is a priority, the Explorer controller with a USB interface is the ideal choice.
Special products can be requested to address specific needs. The Rack- Mountable Instrument (RMI) for example is a self-contained, fully-featured boundary- scan controller, perfect for installation in a 19-inch test rack or in a benchtop set-up. Alternatively our JT 5705 range offer both JTAG TAPs (Test Access Ports) AND mixed-signal IO (MIOS) channels making it virtually a self-contained ATE.
Auxiliary digital I/O scan (DIOS) modules, socket test modules (STM) and independant MIOS products add scan test and analog measurement coverage into portions of your design that lack access - giving you a convenient way to test sockets, connectors and sensors.
We've even got a product for remote operation over any distance, JTAG TapCommunicator. TapCommunicator is a truly unique product that can overcome problems caused by lack of target accessibility. By harnessing the native communications protocol of the target (e.g. E-net, Bluetooth, SpaceWire etc.) boundary-scan tests and programming applications can be applied over virtually any distance.