64 channel desktop Digital I/O Scan (DIOS) module with IDC connectors.

The module provides ‘boundary-scannable’ IO that is synchronized with the boundary-scan devices on your UUT. It has been developed to increase the test coverage of a printed circuit board by providing access to connectors and/or test points (pads). The additional IO access increases the possibilities for testing logic clusters and enhances interconnection test coverage using boundary-scan.

The 64 channels of JT 2111/MPV DIOS-IDC are available on the four 20-way IDC style connectors at the front of the unit. JTAG TAP and power connections are at the rear. Output threshold levels are adjusted through a rotary switch or by software (JFT application).

The JT 2111/MPV DIOS module is also available with a DIN 41612 connector.



  • Compact multi-purpose system
  • Adds testing possibilities
  • (Re)configurable with SCIL functions

Dieses Produkt ist in unserem JTAG Live Shop erhältlich.

  • Compact 64 channel I/O system in rugged housing
  • Choice of connector options (DIN or IDC)
  • Supports high clock (TCK frequencies)
  • TAP-IN, TAP-OUT feature allows daisy-chaining with UUT or other DIOS

JT2111/MPV can be used to extend fault coverage in benchtop or experimental test and board debug set-ups. Equally the unit can be enclosed with a production test fixture solution for volume testing. The 64 I/Os are grouped in four segments of 16 pins. Each segment can be bypassed in order to shorten the chain, thereby providing faster programming of flash devices.

The JT 2111/MPV derives its power from an AC adaptor. The input power supply voltage is hardware or software selectable at 1.5V, 1.8V, 2.5V or 3.3V. If 3.3V is selected, the voltage input is 5V tolerant.

  • 64 channels of digital I/O voltage selectable via rotary switch
  • Supports 3.3V (5V tolerant), 2.5V, 1.8V, 1.5V
  • Choice of connector options (DIN or IDC)
  • 200mA supply voltage for accessories

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