The JTAG/boundary-scan interface and technology is found in most of today’s electronics. The technology was standardized in 1990. Since then more standards have been added each building upon and enhancing the original standard to extend the test coverage of JTAG/boundary-scan.

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Boundary-scan (also known as JTAG or IEEE Std 1149.1) is an electronic serial four port jtag interface that allows access to the special embedded logic on a great many of today’s ICs (chips). The JTAG accessible logic serves a number of functions that can include any or all of the following:


JTAG boundary-scan helps your process in three ways: it saves your organization time, it is cost-effective and it strengthens the quality of your products. To explain how we do that, let’s look into some of the details.


The four port JTAG serial interface and logic were originally developed by a group of test professionals from Philips, BT, GEC, TI and others known as JTAG (the Joint Test Action Group) throughout the late 1980s. The group continued as an IEEE working group to complete the final standard which then got the official name IEEE Std 1149.1, the IEEE Standard Test Access Port and Boundary-Scan Architecture. The standard was first released in 1990. Since then enhancements have been made and the latest update was done in 2013, see IEEE 1149.1-2013.

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