Boundary-scan for Functional Test

Article published in Embedded Systems Design Europe - February/ March 2010.   

JTAG for functional test

Electronics Manufacture & Test - November 2009

The missing link

New Electronics - May 2009 

See the benefits

Electronics Assembly - April 2009

Looking without touching

Electronics Assembly - February 2009

Q5 Interview with Peter van den Eijnden

Electronicsweekly.com - January 2009 

Top10 boundary-scan tips
Summary of the 10 boundary-scan tips article below

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