Universal boundary-scan upgrade for Digitaltest MTS series

MTS500 flying probe testers CONDOR captivate users with their remarkable versatility and flexibility. Apart from traditional ICT test routines, the flying probe tester is also capable of performing functional tests. Tests of prototype boards and small batches are streamlined and cost-effective.

Combining the flying prober with boundary scan, the benefits of both methods sum up to build a powerful test solution. Besides the classical in-circuit-test using four flying probes, functional tests using up to 1012 fixed probes accessing from the bottom side are feasible. The fixed probes can access the UUT using a simple magnetic probe bed or a sophisticated vacuum operated adaptor.

Integrating JTAG Technologies’ boundary scan test methods into CONDOR test programs opens up another dimension for MTS500 CONDOR test applications.

Accessing the TAP ACCESS PORT (TAP) allows for infrastructure and interconnect test without the need for contacting additional nets of the UUT.

Combining both flying probe and boundary scan test methods, the flying test nails could be used as virtual boundary scan cells to raise boundary scan test coverage. On the other hand, functional test coverage could be raised, as various A/D- and D/A-converter tests are possible with only very little effort.

 For debugging or test run, JTAG’s ProVision Software can take over control of the four flying probes. Likewise, JTAG’s hard- and software can  be controlled by Digitaltest’s CITE test program.