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December 6th, 2012
New JTAG Support Option Adds Boundary-Scan Capability to 6TL Functional Testers
Eindhoven, The Netherlands – JTAG Technologies, a leader in boundary-scan PCB test and device programming tools, and 6TL, a functional test systems provider (and JTAG technology partner), announce a high-level JTAG support option for the YAVJTAG and YAVJTAH modules. The new solution allows 6TL users and systems builders to provide JTAG Test and ISP (in-systemprogramming) capabilities using JTAG Technologies’ proven software platforms, such as ProVision and Production Integration Packages (PIP).
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August 22nd, 2012
JTAG Technologies Launches Newest Express Boundary-scan Controller
JTAG Technologies, provider of solutions for testing and programming high-density PCBs, announces a further extension to its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PXIe the new unit offers support for the increasingly popular PXIe/Compact PCI-express slot format that now features in some of the latest Automatic Test Equipment based on the PXI(e) standards.
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August 1st, 2012
JTAG Technologies to Showcase Latest Product Developments at Autotestcon 2012
JTAG Technologies will be showcasing latest developments and products at Autotestcon Anaheim in September this year. Amongst our variety of military and aerospace products, our new JTAG boundary-scan tester/programmer and and the JTAG Functional Test will be presented at Autotestcon.
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June 20th, 2012
Multi-function JTAG Module Addresses Analogue Testing
JTAG Technologies launches the JT 2149/DAF I/O module for digital and analogue measurement JTAG Technologies, a leading world-wide provider of JTAG/boundary-scan products for electronics test and debug, has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.
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February 28th, 2012
JTAG Live takes Command of MicroCores for PCB Test & Debug
Embedded World, Nürnberg, Germany - 28th February 2012: JTAG Live (by JTAG Technologies) is pleased to announce the introduction of a new series of debug tools for DSP and microprocessor systems utilising a variety of RISC and DSP cores. Using JTAG Live CoreCommander engineers can activate the OCD (On-Chip Debug) modes of a range of popular cores to affect ‘kernel-centric’ testing.
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April 14th, 2011
Teradyne and JTAG Technologies announce boundary-scan product collaboration
Teradyne, Inc. (NYSE:TER) announced an agreement with JTAG Technologies to sell and distribute their Symphony/TS boundary-scan product. The solution, designed specifically for Teradyne by JTAG Technologies, provides an advanced boundary-scan test option for manufacturers using Teradyne’s popular TestStation™ and legacy GR228X family of In-Circuit Test systems.
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January 18th, 2011
Eleven for '11
Eindhoven, The Netherlands - January 18. JTAG Technologies has boosted the performance of its industry-leading ProVision suite of boundary-scan development tools with the addition of 11 enhancements. The first of these is the addition of private instructions handling within ProVision's JTAG Functional Test (JFT) capability, now giving users easier access to device registers [other than just those needed for IEEE Std. 1149.1boundary-scan operations]. For example, registers needed to invoke on-chip emulation modes and programming registers can now be accessed using JFT's Python routines.
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September 14th, 2010
Boundary-scan Boost for Huntron Robotic Probers

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May 31st, 2010
Boundary-scan tools keep on developing

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January 25th, 2010
JTAG ProVision™ – Now With Added ‘Buzz’
JTAG Technologies has announced an interim update to its renowned ProVisionTM boundary-scan development tools-suite that includes the new continuity test module ‘Buzz'. Service Pack 1 for CD release 15 (CD15-SP1) is available immediately for download, from our website, for licensed users with current support contracts.
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November 12th, 2009
Free-for-Life Tool Cracks PCB Debug Challenge
With the breakthrough product family, JTAG Live.TM, debugging boards too crowded for traditional probing becomes a whole lot easier. JTAG Live is ideal for electronics engineers and technicians to use in checking PCBs for basic continuity and correct operation. The JTAG Live family consists of three products, Buzz, Clip, and Script, each targeted at different aspects of the debugging process.
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September 29th, 2009
New PCI Express Boundary-scan Controller
JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, announces a further extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PCIe the new unit offers support for the now popular PCI-express slot format found extensively in today's PCs. The PCIe bus is a high-speed serial replacement of the older parallel PCI bus.
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September 15th, 2009
JTAG Test Routines Bend the Coverage Curve
Test engineers have a new weapon in the battle to verify the operation of complex, non-boundary-scan clusters. JTAG Functional Test (JFT) steps up to the challenge, bridging the gap between straight structural testing and functional verification.
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June 22nd, 2009
Geotest and JTAG Technologies announce integrated system
Following a successful series of JTAG / Functional test seminars in Europe and the United States, Geotest - Marvin Test Systems and JTAG Technologies are pleased to announce a new Technology Partnership. Under the partnership, Geotest now offers pre-configured PXI test systems including the JTAG Technologies' high-performance JT 37x7/PXI boundary-scan controller. Included with the boundary scan test option is JTAG Technologies' high-level driver suite for Geotest's ATEasy software which facilitates integrating boundary-scan applications as part of an overall functional test strategy.
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May 19th, 2009
JTAG Technologies Announces Support for Altera ‘VJI’ Virtual JTAG Interface
JTAG Technologies are pleased to announce a new capability that supports the Altera VJI (Virtual JTAG Interface) Megafunction of Arria® Stratix® & Cyclone® series of FPGAs.
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April 28th, 2009
Boundary-scan Best-in-Test award to JTAG Technologies
JTAG Technologies has been selected by Test and Measurement World as the winner in the boundary-scan category of the prestigious Best-in-Test program for 2008. TMW's Best-in-Test judges select among innovative and beneficial products in several categories, placing JTAG Technologies' Rack-Mountable Instrument at the top of the highly-competitive boundary-scan category. The award was presented at the recent APEX show in Las Vegas.
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March 26th, 2009
JTAG Production Programming for Texas Instruments’ Digital Signal Controllers
JTAG Technologies, the leading world-wide provider of boundary-scan products, has further broadened its in-system programming (ISP) support to include a number of popular DSCs (Digital Signal Controllers) from Texas Instruments.
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February 19th, 2009
JTAG ProVision a finalist for EDN’s Innovation Award
JTAG Technologies has been selected as a finalist for EDN Magazine's prestigious Innovation Award for its revolutionary ProVision development tool suite. This award recognizes unique, state-of-the-art electronics products in Design for Test and several other categories.
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February 4th, 2009
Boundary-scan leaps forward in ease-of-use and visualization
JTAG Technologies' groundbreaking advance in the boundary-scan tool space continues with the latest release of its development tools, JTAG ProVision and Visualizer. Already setting the standard for ease-of-use combined with superior test quality, the pair of design tools now delivers even more functionality and performance.
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November 11th, 2008
‘Skilful’ JTAG Hardware Delivers Best of Both Worlds
IEEE std. 1149 compliant boundary-scan products, has introduced the new compact JT 2149/MPV Digital I/O Scan (DIOS) module, which allows digital I/O test access to PCBs requiring external I/O stimulus and response monitoring.
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October 31st, 2008
Teradyne and JTAG Technologies Provide Test Solution for Advanced Digital Networks
October 28, 2008 - Teradyne, Inc. (NYSE: TER) and JTAG Technologies have jointly demonstrated the ability to test and diagnose advanced digital networks with an integrated boundary-scan solution running on the Teradyne(R) TestStation(TM). This means that TestStation users can expand the test coverage achieved via boundary-scan on their boards to include such networks as LVDS, AC-coupled, and others.
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September 1st, 2008
JTAG Technologies supports wide range of Freescale controllers with embedded Flash
JTAG Technologies, a leading provider of IEEE Std. 1149.x boundary-scan solutions for testing and programming printed circuit boards, now offers a family of programming tools for a large number of Freescale Semiconductor controllers with on-chip flash memory. The programmers all offer the convenience and efficiency of on-board programming, allowing blank controllers to be soldered on the PCBs for configuring later and as often as necessary.
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August 20th, 2008
JTAG Technologies’ ProVision raises the boundary-scan bar
JTAG Technologies continues to lead the boundary-scan industry forward with the latest release of its flagship development tool, JTAG ProVision. Already setting the standard for ease-of-use combined with superior test quality, ProVision now encompasses even more functionality within its highly graphical user interface.
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July 1st, 2008
A boundary-scan integration breakthrough for the Agilent 3070
Stevensville MD, July 1, 2008 - JTAG Technologies, a leading provider of IEEE Std. 1149.x solutions for testing and in-system programming of PCBs, has announced a dramatic improvement in integrating boundary-scan within the popular 3070 In-Circuit Test (ICT) systems of Agilent Corporation. The new JT 37x7 / APC controller combines in a single plug-in unit all of the hardware elements required for a high-performance boundary-scan solution for PCB testing and in-system programming. Because the APCTM is fully compatible with a single-density 3070 pin-card slot, the new unit provides extremely convenient installation with minimum cabling and thus optimum signal performance.
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June 17th, 2008
JTAG Technologies breaks the barrier between functional testing and boundary-scan
London, June 17 2008 - JTAG Technologies, a leading provider of IEEE Std. 1149.xbased solutions for testing and in-system programming of PCBs, has tackled the barrier between structural and functional testing. With the announcement of the newest member of the highperformance DataBlaster line of boundary-scan controllers, it becomes a simple matter for electronics manufacturers to combine boundary-scan performance and test coverage with functional validation. The new JT 37x7 / RMI (rack-mounted instrument) is conveniently packaged in a standard 19-inch by 1U form factor for compatibility with virtually any rack-mounted functional test system. The RMI supports all boundary-scan test applications including IEEE 1149.6 advanced digital network testing as well as in-system programming (ISP) of flash memories and programmable logic devices. With its four fully-compliant boundary-scan test access ports (TAPs), the RMI delivers excellent signal integrity at the target. In addition, the RMI provides 256 programmable I/Os to further enhance test coverage. TAPs and I/Os are available on the front panel of the unit, and the TAPs can be combined for test purposes or ganged for high-throughput testing and ISP. The TAPs can also be extended via flat cables from the front panel to satisfy special fixturing requirements. I/O channels are individually programmable as input, output, bi-directional or tri-state, and voltage thresholds can be programmed to 1.5, 1.8, 2.5, or 3.3V for use with modern low-voltage logic families. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed. The RMI is powered from the host computer and interfaces to the computer via three standard formats, USB 2.0, Ethernet 10/100 and IEEE 1394 Firewire, giving it nearly universal applicability and ease-of-use. Test clock frequency is programmable up to 40 MHz allowing very rapid application execution, especially important for flash programming, while TAP voltages can be set for a wide range of input and output characteristics. The RMI meets the need to combine boundary-scan operations with functional attesting perfectly-it's platform-neutral, equally at home in PXI-, VXI- or PCIbased test environments. And, because the RMI is completely self-contained with no auxiliary units, it is easily moved between test stations. Furthermore, in addition to rack-mounted test setups, the RMI is ideal for benchtop applications. The new controller is fully compatible with all JTAG Technologies' development tools such as JTAG ProVisionTM and JTAG Visualizer. In combination with functional testing, the RMI works seamlessly with the industry's most popular architectures including National Instruments LabVIEW, LabWindows and TestStand as well as custom C/C++ and Visual Basic test systems. Pricing for the JT 37x7/RMI begins at $6,500; the product is available for immediate shipment. About JTAG Technologies JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated flash and PLD programming via boundaryscan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Alcatel-Lucent, Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 5,500 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defense, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands. JTAG Technologies is a registered trademark and JTAG TapCommunicator is a trademark of JTAG Technologies, Inc. All other brand names or product names mentioned are trademarks or registered trademarks of their respective holder.
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May 27th, 2008
New JTAG Module Simplifies High-Speed Integration
JTAG Technologies, a leading provider of boundary-scan test tools and an Aeroflex technology partner, announces the availability of the JT 2147/AGP boundary-scan interface for use with Aeroflex high-performance In-Circuit Testers (ICTs).
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April 14th, 2008
JTAG Technologies – more focus on Russia with brand new Russian website and show activities at ExpoElectronica 2008
Bedford, United Kingdom & ExpoElectronica 2008, Moscow - 15th April 2008. As part of its ongoing global expansion, JTAG Technologies, the leading provider of IEEE std. 1149 compliant boundary-scan solutions, has opened an office in St. Petersburg, Russia. Alexey Ivanov, who has considerable experience in boundary-scan and other test fields, has been appointed as the Sales Manager.
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November 15th, 2007
Forging the Boundary-Scan path toward greater functionality and ease-of-use
JTAG Technologies continues to drive the boundary-scan industry forward with the latest release of its flagship development tool, JTAG ProVision. Already setting the pace in the industry in terms of comprehensiveness and ease-of-use, ProVision now encompasses even more functionality within its highly graphical user interface.
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November 12th, 2007
Prevas and JTAG Technologies sign Co-operation agreement
Today, Prevas and JTAG Technologies, a leading supplier of boundary scan tools, announce a new industry collaboration. Prevas customers in Sweden and Demark can now be offered additional expertise within the important area of boundary-scan technology that is extensively used for testing and device programming of printed circuit cards and electronic systems.
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November 7th, 2007
JTAG Technologies renowned JT 3705 Explorer goes USB
JTAG Technologies, a leading provider of IEEE Std. 1149.x based solutions for testing and in-system programming of PCBs, announces a USB version of its renowned, low-cost JT 3705 Explorer.
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September 28th, 2007
New Digital I/O Scan Test Module Provides Flexibility
JTAG Technologies, a leading world-wide provider of IEEE std. 1149 compliant boundary-scan products, has introduced the JT 2111/MPV Digital I/O Scan (DIOS) module. The module retains a legacy form-factor and default settings but adds programmable voltages to facilitate the enhanced testing of complex printed circuit boards.
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July 30th, 2007
New Custom Function Module streamlines integration of Boundary-Scan with Teradyne TestStation
JTAG Technologies announces the availability of the JT 2147 Custom Function Module (CFM) for use with its Symphony 228xPLUS integration package for Teradyne's TestStationTM in-circuit testers (ICT).
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June 27th, 2007
Boundary-scan in the limelight
European User Meeting in Amsterdam an absolute success. JTAG Technologies filled two days of seminars for its European customers with interesting technical presentations, news and shoptalk.
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