JT 37x7 / TSI

• Triple serial interface (USB 2.0, Ethernet and  

   Firewire)

• Modular function adaptation

• 40 MHz sustained TCK

• Four 1149.x TAPs

• 144 mm width x 220 mm depth x 40 mm height

JT 3705 / USB

• Compatible with USB 1.1 and 2.0 formats

• Two fully-compliant 1149.x TAPs

• TCK up to 6 MHz

• Programmable TAP voltage

• 57 mm width x 79 mm depth x 16 mm height

JT 37x7 / RMI

• Rack-Mountable Instrument 

• Fully featured DataBlaster boundary-scan controller

• 1 U x 19 " form factor

• Triple serial interface

• 4 TAPs and 256 I/Os on front panel

• 440 mm (19") width x 350 mm depth x 1U height

JT 37x7 / PXI

• Plug-in controller for PXI-1 and PXI Express Hybrid Slots

• Modular function adaptation

• 40 MHz sustained TCK

• Four 1149.x TAPs

• 130 mm width x 189 mm depth x 20 mm height

JT 37x7 / PXIe

• Plug-in controller for a PXI Express Peripheral Slot

• Modular function adaptation

• 40 MHz sustained TCK

• Four 1149.x TAPs

• 130 mm width x 189 mm depth x 20 mm height

JT 37x7 / PCI

• PC plug-in PCI interface

• Modular function adaptation

• 40 MHz sustained TCK

• Four 1149.x TAPs

• 130 mm width x 189 mm depth x 20 mm height

JT 37x7 / PCIe

• Pc plug-in PCIexpress interface

• Modular function adaptation

• 40 MHz sustained TCK

• Four 1149.x TAPs

• 130 mm width x 179 mm depth x 20 mm height

JT 37X7 / APC

• Agilent Pin-Card Controller

• 3070 test head plug-in

• Ethernet, USB & Firewire

• 40 MHz sustained TCK 

• Four 1149.x TAPs 

• 407 mm width x 520 mm depth x 20 mm height

JT 2147 QuadPOD

• Four boundary-scan ports

• Enhanced signal integrity for high data rates

• Detachable PODs 

• Programmable I/O voltages

JT 2149 / MPV

• Plugs into QuadPOD slot

• Includes stream-through TAP POD operation

• Programmable, multi-voltage

• SCIL^TM (Scan Configurable Interface Logic)

   technology for advanced functional testing

JT 2149 / DAF

• Compact mixed signal measurement module
• Powered and hosted by DataBlaster QuadPod
• Enables direct voltage and frequency measurements on a DataBlaster.
• Simplifies test system engineering
• 16 dual purpose I/O and frequency channels
• Analog voltage measurement on 12 channels
• Programmable clock generator channel

JT 2137 POD

• Four JTAG TAPs at 3.3V or 5V
• Compact size
• Easy mounting option for fixtures

JT 2147 / DAK for MAC Panel

• QuadPOD specifically designed for use with a MAC Panel ‘Scout’
• Four TAP QuadPod technology
• Match to DataBlaster PXI controllers
• Simplifies wiring to mass interconnect interfaces

JT 2111 / MPV DIOS module

• Compact 64 channel I/O system in rugged housing
• Supports high clock (TCK frequencies)
• TAP-IN, TAP-OUT feature allows daisy-chaining with UUT or other DIOS
• (Re)configurable with SCIL functions 
• Available with 96-pin DIN 41612 connectors and 20-pin 0.1" pitch IDC connectors

JT 2122 / MPV DIOS Module

• Generic DIOS module

• DIMM-168 form factor suits JT 2702 series

• 128/133 channels

• Voltage thresholds determined by Vcc supply

JT 2124 / F168 DIOS module

• Configurable 128 channel DIMM DIOS in 168 pin format
• Ability to program I/O thresholds across a block of 16 channels
• Improves fault coverage via connector and/or test-point access

JT 2128 DIOS Module

• Compatible w/ 168-pin DIMM sockets

• Enhances test coverage

• Programmable functionality

• Programmable voltage

JT 2127 STM

• Compatible w/ standard DIMM sockets

• Range of pinouts

• Verifies power and ground voltages

• Programmable voltage

JT 2149 / MPV

• Plugs into QuadPOD slot

• Includes stream-through TAP POD operation

• Programmable, multi-voltage

• SCIL^TM (Scan Configurable Interface Logic)

   technology for advanced functional testing

JT 2702 / PCI-Slot DIOS

• Test jig for PCI cards
• 2 PCI bus slots for 32/64 bit boards
• 2 JT 2122/MPV DIMM DIOS slots plus 2 power select DIMM slots
• UP to 83 spare I/O channels for testing

JT 2702 / DCC DIOS adapter

• Dual DIMM Carrier (break-out board)

• Houses 1 or 2 DIMM-168 form DIOS

• I/O channels accessed through standard

IDC 40- way headers

• Fixture mountable, may be 'daisy-chained'

JT 2156 Training Board

• Platform for demonstrating and/or training with ProVision and JTAG Live tools
• 21st century mixed signal design:
  ARM 7TDMI Core NXP processor
  Altera Cyclone 3 FPGA
  DDR2 memory block
  Serial SPI  memory
  Analog to Digital Converter
  Accelerometer
  Touch screen controller

JT 2143 / JT 2144 TapCommunicator

• Supports remote boundary-scan operation

• Gigabit Ethernet channel between controller and

   target

• Zero signal degradation between uplink and

   downlink modules

• Full boundary-scan functionality

JT 2149 Connector

• Safe easy connection of TAP pods to the JT 37x7/RMI
• Helps to maintain signal integrity  to the point of test
• Simplifies system configurations 

JT 2147 / CFM

• Custom Function Module

• Compatible with Teradyne Custom Function Board

• Easily incorporates boundary-scan into TestStation

   ICT system

• 95 mm width x 290 mm depth x 11 mm height

JT 2147 / AGP

• Aeroflex GPIO Pod

• Plugs into Aeroflex 42xxGPIO card slot 

• Provides4-TAP QuadPOD functionality

• Contains isolation to separate signals from Aeroflex test system