Design your applications fast and thoroughly with JTAG ProVision
Drawing on our unmatched industry experience and engineering know-how, we've leveraged the robustness and dependability of our professional-grade Classic boundary-scan tools to create JTAG ProVision. ProVision has quickly earned recognition as the leading development tool for all boundary-scan applications. It's the only tool that combines advanced automation with the level of control and precision that engineers demand to maximize their designs. With ProVision, you'll quickly prepare your tests and in-system programming routines and then be able to examine and manage the details for optimum coverage. Consider some of the features and benefits:
Able to handle single- chain and multi-chain boards, single- and multi-board designs | Give system designers maximum flexibility and minimum constraints Prepare tests and ISP routines quickly, even for complicated system architectures |
Design wizard for all applications | Easy to learn, can be picked up rapidly even after extended period of not using the system |
Advanced viewing and controls | Optimize designs for maximum coverage |
Integrated with JTAG Visualizer | See your boundary-scan results on your schematic and layout |
Fault coverage analysis | Know your coverage before going to board layout Compare actual test results with the optimum obtainable for your design |
Automation based on device model library | Prepare tests and in-system programming applications rapidly |
Support for IEEE 1149.6 | Develop tests automatically to detect and diagnose faults in advanced digital networks such as LVDS with pin-level accuracy |
There's no need to trade-off with ProVision. Get the best of both worlds, ease of use and high quality results. Convince yourself;
View the JTAG ProVision video.
- Download a copy of the informative ProVision brochure.
- Reduce design spins and optimize test results. Follow the guidelines in our informative DFT booklets.
Contact us to learn more about JTAG Visualizer and how it can boost your results and help you get the most from boundary-scan.
Request a FREE 30-day boundary-scan software evaluation.
JTAG Technologies provides support for a wide range of programmable devices, including embedded flash, NAND, programmable system devices, etc. For details refer to our Special Device page.
JTAG Functional Test
JFT provides a new way to develop cluster tests (that is, tests of non-boundary-scan portions of the board). Unlike the traditional vector-based approach, JFT is language-based, enabling the test engineer to write a program using the popular open-source Python language to create a test for even highly complex sequential clusters.
With the ability to drive and sense both individual pins and groups of pins, and by harnessing the flow control of a high-level language, users can create sophisticated tests for devices or functions comprising groups/clusters of devices. JFT simplifies testing mixed signal parts such as ADCs and DACs, testing parts that require user intervention, looping test patterns to set-up device registers etc.
Download the JFT Specsheet
