Partitioned Scan Chains

Despite popular belief, connecting all boundary-scan devices in a single chain is not always the best Design For Test practice. There are several reasons one should consider partitioning of scan chains such as optimization of flash programming, avoiding additional level translation devices for different voltage families and meeting requirements of proprietary debugging tools. 

JTAG Technologies' hardware and software easily supports multiple scan chains and voltage levels. For more Design For Test tips, request a copy of our DFT Guidelines booklet today.