Reduce development costs

Want to cut weeks off prototype debugging during development and avoid time-consuming, inflexible pre-programming of devices? With JTAG Technologies' solutions, you can program logic devices and flash memories after PCB assembly - and easily re-program when design changes occur.

Our industry leading tools, JTAG ProVision and JTAG Visualizer provide the development backbone. Use JTAG ProVision to get tests and ISP routines that are precise, complete, and ready quickly. Use JTAG Visualizer to gain graphical images of your boundary-scan applications right on your schematic and board layout for easy comprehension and analysis.

Find out more about JTAG ProVision and JTAG Visualizer.

JTAG Functional Test (JFT)

JFT provides a new way to develop cluster tests (that is, tests of non-boundary-scan portions of the board).  Unlike the traditional vector-based approach, JFT is language-based, enabling the test engineer to write a program using the popular open-source Python language to create a test for even highly complex sequential clusters.

With the ability to drive and sense both individual pins and groups of pins, and by harnessing the flow control of a high-level language, users can create sophisticated tests for devices or functions comprising groups/clusters of devices. JFT simplifies testing mixed signal parts such as ADCs and DACs, testing parts that require user intervention, looping test patterns to set-up device registers etc.

Download the JFT Specsheet