Improve time to market while reducing costs

JTAG Technologies offers a comprehensive selection of best-in-class run-time solutions. Whether you are an OEM or a contract manufacturer, we have a run-time solution targeted to meet your needs. Choose a stand-alone boundary-scan system or one of our many integration alternatives for in-circuit, flying probe, in-line, or functional testing.

• Reduce costs -shorten your  time to market. Boundary-scan shrinks test development times, decreases debug time for prototypes and expedites re-programming during firmware debugging. Test fixtures are greatly simplified and may be eliminated altogether.

• Increase accuracy - start test engineering earlier in the product cycle, based on pre-layout design information and using timesaving automated tools. Test programs are ready at the start of production, complete with high-resolution diagnostics for repairs.

• Improve beat rate - boundary-scan ensures PCBs are correctly assembled and programs flash memories and PLDs in-system at high throughput rates.

We offer a broad line of solutions to execute your boundary-scan applications either in a stand-alone station or seamlessly integrated into your existing in-circuit test system, flying prober, or functional test system. Integration allows you to capture the combined benefits of boundary-scan and the legacy methodology without a major investment. For more information, refer to our informative production solution brochure.

JTAG Technologies provides support for a wide range of programmable devices, including embedded flash, NAND, programmable system devices, etc.  For details refer to our Special Device page.