Strategic Partners

National Instruments

JTAG Technologies is a Corporate Partner, and an Alliance Partner of National Instruments. JTAG Technologies' products are fully compliant with National Instruments range of products such as PXI-based boundary-scan controllers, production integration software packages for TestStand, LabVIEW and LabWindows.

National Semiconductor Corporation

National Semiconductor's System Test Access (STA) product line and JTAG Technologies cooperate in defining strategic system-level and analog testing solutions to meet today's real-world problems in electronics manufacturing. As a result, National Semiconductor provides chips enabling such solutions, while JTAG Technologies provides products and features to support the solutions using National's PCB- and system-level devices. For example, the JTAG-1149.4 Explorer is a product that enables designers to explore and exploit the capabilities of the National STA400 chip, featuring IEEE 1149.4 (Standard for analog testing via boundary-scan). Also, JTAG Technologies' development software contains built-in support for National's ScanBridge family of chain management ICs.

LogicVision

JTAG Technologies is an LVReady partner of LogicVision. The partnership streamlines the integration of device-level embedded test and diagnosis with board and system level testing. Users benefit not only from productivity gains but also from the ability to significantly reduce the product long term support costs by eliminating the many no-fault-found (NFF) rejects by re-using the test patterns embedded within device silicon at device level, board level and further into the field environment. The ability to access this powerful embedded test capability and analyse the resultant test data in conjunction with LogicVision's 'LVReady' design database, allows customers to diagnose faults within device silicon to gate level.

Products from JTAG Technologies, developed in co-operation with LogicVision, enable on the one hand, an ASIC containing an embedded test to be tested via the boundary-scan interface with resulting test data analyzed in conjunction with LogicVision's design database. On the other hand, a boundary-scan test can request that an embedded device test be run as part of a higher-level board or system test.