Articles 2010
Embedded instruments for JTAG Testing
US Tech, December 2010
Presentation on the embedded forum at Electronica 2010
November, 2010
Versatile boundary-scan also programs and debugs
US Tech, August 2010
Electronics, April 2010
White paper: Micron PCM programming using boundary-scan
Boundary-scan for Functional Test
Article published in Embedded Systems Design Europe - February/ March 2010.
Jednoduchá diagnostika desky pomocí JTAG Live
Czech article in Sdelovaci Technika - February/March 2010
