Seminars
Introduction: JTAG, IEEE 4491.X
Hosted by: Telefunken Semiconductor
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How your competition uses JTAG as a competitive advantage | September 7, Dallas, TX |  |
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How your competition uses JTAG as a competitive advantage | September 8, Houston, TX | |
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How your competition uses JTAG as a competitive advantage | September 9, Austin, TX | |
Nordic User Meeting 2010
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Nordic User Meeting 2010 | October 6, Talinn |  |
Boundary-scan seminar with National Instruments
Combining boundary-scan with modulair PXI based functional testing.
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Boundary-scan Seminars
These seminars are an introduction for test engineers and HW designers to testing in general. Boundary-scan is one of the major test methods which will be discussed.
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FREE Hands-on Boundary-scan Seminars USA/Canada
These seminars are offered throughout the US and Canada and are ideal for test engineers and hardware designers who want to learn more about board and system testing. An introduction to boundary-scan technology is provided along with valuable tips on designing for test. The seminar includes a summary of the JTAG Technologies product line and services and concludes with a demonstration of the primary tools.
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Boundary-scan Workshops Europe
These events are targeted for Test engineers and HW designers who want to have a good understanding of the value of Boundary-scan for their designs. 40% of the time will be used to work yourself with the tools from JTAG Technologies on a training board.
